It would be nice to allow us to use custom sequences with repeated (duplicate) patches, and allow us to choose how we want to handle the multiple measurements for duplicate patches.
Right now, the Advanced Operation notes
explicitly state that duplicate patch values are not allowed:
Note: Each patch should be unique, with no repetition of identical patch values.
If you have a custom sequence that contains the same patch/color more than once, it seems like the most recent measurement is used and any prior measurements of that same color are discarded.
It would be great if ColourSpace would instead keep all
measurements, including those of repeated patch values, and provide options during LUT generation on how to handle measurements of repeated patch values. For example, the measurements could simply be averaged together, or could be intelligently combined with the Drift compensation feature (using the drift data to correct each measurement, then averaging the corrected measurements).
Perhaps the Drift feature could even be extended to estimate drift using the measurements of all repeated patch values in addition to the explicitly inserted drift patches.Motivation
I am trying to refine the low-luminance grayscale response of a WRGB OLED display. Because the meter I am using (i1Display Pro OEM) has poor accuracy at low luminance levels, I would like to take many measurements of the low-luminance grayscale patches and average them together to attempt to mitigate the limitations of the meter.
I could use the "Average Low Light" feature in the Probe Options tab to do this, but I would prefer to spread out the duplicated patches/measurements throughout my custom patch sequence, rather than taking them all at the same time, because of the drift issues with an OLED display. Using "Average Low Light" means that the display is dark for a significant period of time while the multiple measurements are taken, allowing it to cool down and significantly increasing drift.
Instead, it would make more sense to take the measurements throughout my (anisometric) custom patch sequence, and average them as a post-processing operation during LUT generation. The first step to allow this is obviously to store all measurements for repeated patch values.