It would be nice to allow us to use custom sequences with repeated (duplicate) patches, and allow us to choose how we want to handle the multiple measurements for duplicate patches.

Right now, the Advanced Operation notes explicitly state that duplicate patch values are not allowed:


If you have a custom sequence that contains the same patch/color more than once, it seems like the most recent measurement is used and any prior measurements of that same color are discarded.

It would be great if ColourSpace would instead keep all measurements, including those of repeated patch values, and provide options during LUT generation on how to handle measurements of repeated patch values. For example, the measurements could simply be averaged together, or could be intelligently combined with the Drift compensation feature (using the drift data to correct each measurement, then averaging the corrected measurements).

Perhaps the Drift feature could even be extended to estimate drift using the measurements of all repeated patch values in addition to the explicitly inserted drift patches.

Motivation
I am trying to refine the low-luminance grayscale response of a WRGB OLED display. Because the meter I am using (i1Display Pro) has poor accuracy at low luminance levels, I would like to take many measurements of the low-luminance grayscale patches and average them together to attempt to mitigate the limitations of the meter.

I could use the "Average Low Light" feature in the Probe Options tab to do this, but I would prefer to spread out the duplicated patches/measurements throughout my custom patch sequence, rather than taking them all at the same time, because of the drift issues with an OLED display. Using "Average Low Light" means that the display is dark for a significant period of time while the multiple measurements are taken, allowing it to cool down and significantly increasing drift.

Instead, it would make more sense to take the measurements throughout my (anisometric) custom patch sequence, and average them as a post-processing operation during LUT generation. The first step to allow this is obviously to store all measurements for repeated patch values.

As you say: If you have a custom sequence that contains the same patch/color more than once, it seems like the most recent measurement is used and any prior measurements of that same color are discarded.

That is correct, and there is no way all measurements can be kept within ColourSpace.
You can ONLY have one valid measurement per profile.

But, you can use Measure & Log, or Secondary Execution to perform such unique processes/measurements.
That is exactly why such options exist.

Steve

Steve,

I would like to try implementing what I describe using Measure & Log or Secondary Execution, so I have a couple questions:

1. Do the measurements passed to Measure & Log or Secondary Execution include the probe matching corrections?
2. If I post-process the measurements using some external script/software, is there a way to re-import them back into the profiling window so I can use the custom-processed measurements for LUT generation?

Thanks,
Erik

Please see the Interactive User Guide, the Remote Control Guide, and the Video Guides, as well as the info in the available Customer Downloads.
All is explained.

As for re-importing, just make a .BCS file, in the correct format, and import it.

Steve